Atomic Force Microscope (AFM)

LovaLite represents the Italian scanning probe microscope manufacturer, A.P.E. Research.

www.aperesearch.com

Description

The A100-AFM SGS is equipped with a closed loop sample positioning system. It guarantees absolute positioning with an accuracy of 10 nm (up to ten times better than closed loop AFM in the market). This particular feature, together with the specific A.P.E. Research software tool, makes the instrument suitable for nano-lithography.

The A100-AFM SGS is equipped with a flexure scanning stage that guarantees high planarity for customers interested in large area AFM measurements (up to 100 μm). A.P.E. Research has developed additional AFM tools for specific measurements modes (EFM, MFM, Liquid Cell). Other tools are developed upon customer requests or in a joint collaboration with Italian research institutions.

LovaLite also provides calibration standards for your AFM.

Specifications

A100-SGS SPM Stage
Scanning stage with absolute positioning system with strain gauge sensors. Scanner technical data:
X-Y:	100 x 100 μm (high voltage mode); 10 x 10 μm (low voltage mode); Resolution high voltage mode: Closed loop: 2 nm, Open loop: 0.2 nm Closed loop linearity: 0.1%.	Z:	10 μm (high voltage mode) 1 μm (low voltage mode) Resolution: 0.16nm (high voltage mode) 0.02nm (low voltage mode)
AFM head		SPMCU2-PI
AFM Head is suitable for Contact Mode, Non Contact Mode, Semi-Contact Mode and Lateral Force. AFM Head with holder for commercial cantilevers. The holder can be removed to easy mount cantilevers. The head also houses laser, photodiode sensor with preamplifier.		SPM Control Unit SPM Control Unit and PC (equipped with a multi input-output board) drives the scanner, data acquisition and sample motion. Tip to sample distance is controlled by ultra-low noise analog feedback, digitally driven by PC. High speed and temporal precision are provided by hardware timing.
Computer, Acquisition board and software
Software runs under Windows and is composed of a multi-window applications for instrument control and data acquisition. The software comes equipped with simple filters for immediate analysis of acquired images. The software controls all the parameters of the instrument. A.P.E. Research instruments are equiped with the "open source" SPM data analyze software Gwyddion (available on Windows and Linux). The software SPIP is also available on request.